Zhengpeng Wang (Special session 1)

Invited Talk: Zhengpeng Wang, Beihang University

Special session 1: EMC and OTA Testing for the Next Generation Communication Devices

 

Short Bio: 
Zhengpeng Wang was born in Shandong, China, in 1981. He received the B.Sc. degree in electronic science and technology from Shandong University, Jinan, China, in 2004, and the M.Sc. and Ph.D. degrees in electromagnetic field and microwave technology from Beihang University, Beijing, China, in 2007 and 2012, respectively.
He was a Visiting Researcher with the Antenna and Applied Electromagnetic Laboratory, University of Birmingham, Birmingham, U.K., in 2009 and 2010. From 2013 to 2015, he was a Research Fellow with the University of Kent, Canterbury, U.K., and the University of Science and Technology Beijing, Beijing, China. He is currently an Associate Professor with the Beihang University. His current research interests include Over the Air (OTA) test, reconfigurable antennas, filtering antennas, and antenna measurement.

Title:  Fast Phased Array Calibration Method Based on Multiple Measuring Probes

Abstract:
Fast Phased Array Calibration Method Based on Multiple Measuring Probes This paper presents a fast phased array calibration method which significantly reduces the number of antenna under test (AUT) amplitude and phase setting states. Multiple measuring probes are introduced to record transmission coefficients as AUT works at different states. A coefficient matrix with a small condition number is constructed to calculate the initial excitation coefficients of each antenna element. Simulation results show that the coefficient matrix condition number can be reduced to 1 by optimizing the geometry of the measurement system. When the signal-to-noise ratio is higher than 18dB, the amplitude error of the calibration result is less than 0.5dB and the phase error is less than 20 degrees in the optimal conditional number configuration. This method effectively reduces the measurement time for the phased array calibration and improves the stability of the calibration system.